Tuesday, April 23, 2019

EEVblog #1204 – Samsung Galaxy Fold Failure – Analysis

EEVblog #1203 – REPAIR: Tektronix 2465B Oscilloscope

Deep learning brings a new dimension to machine vision

Although the concepts of deep learning, artificial intelligence and cognitive systems are not new, they are only now being applied in machine vison systems.

from Factory Automation https://www.vision-systems.com/articles/print/volume-24/issue-4/features/deep-learning-brings-a-new-dimension-to-machine-vision.html

Open embedded architecture enables camera synchronization and blow-fill-seal process control

Open standard embedded computing architectures such as MicroTCA, cPCI Serial, and COM Express provide long-term scalability, reduced risk and time-to-market in multi-camera, machine vision applications.

from Factory Automation https://www.vision-systems.com/articles/print/volume-24/issue-4/features/open-embedded-architecture-enables-machine-vision-camera-synchronization.html

Line-scan camera-based machine vision system detects antenna trace defects on automotive glass

A contact image sensor (CIS) line scan camera improves vision system resolution to identify defects such as holes, voids, and breaks in screen printed antenna traces on automotive glass.

from Factory Automation https://www.vision-systems.com/articles/print/volume-24/issue-4/features/machine-vision-system-detects-antenna-trace-defects-on-automotive-glass.html

OCR software and machine vision camera team up to inspect cereal and snack labels at high speeds

EPIC Machine Vision Systems’ machine vision system uses one camera and optical character recognition software to meet quality standards and industry food-safety standards at a top manufacturer of cereal and snack products.

from Factory Automation https://www.vision-systems.com/articles/print/volume-24/issue-4/departments/technology-trends/vision-system-inspects-cereal-and-snack-labels-at-high-speeds.html